Description | single crystal substrate, <100>, ≥99.99% trace metals basis |
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IUPAC Name | oxo(oxoalumanyloxy)lanthanum; |
Molecular Weight | 213.89 g/mol |
Molecular Formula | LaAlO3 |
Canonical SMILES | O=[Al]O[La]=O |
InChI | 1S/Al.La.3O |
InChI Key | KJXBRHIPHIVJCS-UHFFFAOYSA-N |
Melting Point | 2080 °C (lit.) |
Flash Point | Not applicable |
Density | 6.52 g/mL at 25 °C (lit.) |
Storage | room temp |
Assay | ≥99.99% trace metals basis |
EC Number | 234-433-3 |
MDL Number | MFCD00144550 |
Packaging | 1 EA |
Quality Level | 100 |
Semiconductor Properties | <100> |