Wafer Characterization Analysis

Alfa Chemistry is the world-leading materials characterization and engineering resource for semiconductors. Our analytical services provide valuable answers for semiconductor clients as they develop new processes and transfer processes to production. We provide series of analysis services for semiconductor wafers, which are the basic substrates for the development of semiconductor, LED and PV devices.

Our experience includes professional analysis of characteristics such as thickness, surface roughness and defects. Alfa Chemistry laboratory uses a variety of different characterization methods to provide customers with answers. Generally, one or more techniques for a given problem are selected based on the required information and the form of the sample.

Alfa Chemistry's wafer analysis services can be applied to:

• Research and development: for basic research and testing of new concepts
• Process development: to test new processes, designs and tools
• Production: qualified materials; quality control
• Failure analysis: investigate problems for pollution/defect analysis
• Process improvement: monitoring process changes and subsequent process performance

Alfa Chemistry's Wafer Characterization Analysis Services are as Follows:

ThicknessTTV/WARP/BOWSurface RoughnessOrientationResistivitySurface DefectsRaw MaterialsWafer EdgeImpuritiesSolar Cells

Detectable Wafer Types

Methods

Testing Service Process

• The client provides a corresponding number of samples and related technical data. Specific requirements are discussed.
• After reviewing the contract, the client shall go through the payment procedures with the "Entrusted Inspection Agreement".
• After receiving the sample, we will test and analyze the samples within the time limit and issue a test report. The test report can be mailed.
• If the client has doubts about the test report, an appeal within 15 days from the date of receipt of the report can be filed to us.