The ability to create perfect ultra-thin films is crucial to the manufacture of structural elements such as semiconductor devices, sensors, and electronic equipment. The manufacture of semiconductor devices begins with the deposition of extremely thin films of materials on silicon wafers. As semiconductor devices such as those found in computer chips shrink, accurate measurement of these films and their formation conditions becomes increasingly important. Alfa Chemistry provides customers with semiconductor thin film characterization services.
Thin film characterization is one of the core technologies at Alfa Chemistry. As a global leader, Alfa Chemistry has supported hundreds of research institutes, universities and companies in the R&D and manufacturing process. Raising the bar on quality, performance, and problem solving is how Alfa Chemistry finds new and innovative ways to help our clients reach their goals.
Our film analysis covers a range of possible scenarios which strongly influence the choice of techniques used:
Semiconductor and Disk Drive
Photovoltaic and Solar
Alfa Chemistry measures and provides film process control for important parameters such as temperature, deposition rate, film thickness, stress, curvature, bow, reflectivity, surface roughness, and many other material properties.
Our film characterization service is used to extract real-time information from today's most advanced deposition and processing applications within the compound semiconductor, silicon semiconductor and photovoltaic advanced thin film production and R&D.
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