Lithium niobate wafers are renowned for their use in surface acoustic wave (SAW) devices, such as SAW filters, which benefit from their low insertion loss. However, these crystals' optical transparency and pyroelectric effects can present challenges during processing and application. Black lithium niobate wafers offer an effective solution to these issues. Black lithium niobate wafers can be produced through a chemical reduction process in a mixed atmosphere of CO2 and H2. The obtained lithium niobate wafer has a high ability to neutralize charges rapidly, even when there is an instantaneous potential. Consequently, the pyroelectric effect in black lithium niobate wafers is largely eliminated, and the optical transmittance is considerably reduced. Despite these changes, the piezoelectric properties of black lithium niobate wafers remain comparable to those of standard lithium niobate wafers. In a word, the black lithium niobate wafers' ability to mitigate issues related to optical transparency and pyroelectric effects, without compromising its piezoelectric performance, makes it highly suitable for various high-frequency SAW device applications.
At Alfa Chemistry, we offer premium quality black lithium niobate wafers. Our products are meticulously engineered to cater to the needs of advanced technological applications. And each batch of black lithium niobate wafers goes through stringent testing and quality assurance processes. For examples, we use cutting-edge testing equipment to evaluate the electrical, optical, and physical properties of the wafers such as volume conductivity and light transmittance. The obtained results showed that the pyroelectric effect of lithium niobate wafers was basically eliminated and the transmittance was obviously reduced.
Black Lithium Niobate Wafers | ||
Catalog | SC-TFW008 | |
Curie Temp | 1142±2.0 ℃ | |
Cutting Angle | X, Y, Z, Y36, Y41, Y64, Y128, etc. | |
Diameter/Size | 3"/4"/6"/ 8" | |
Tolerance (±) | <0.20 mm | |
Thickness | 0.18-0.5 mm or more | |
Primary Flat | 22 mm /32 mm /42.5 mm /57.5 mm /semi notch | |
Surface Type | Single side polished /Double sides polished | |
Polished Side Ra | <0.5 nm | |
Surface Quality S/D | 20/10 | |
Edge Criteria | R=0.2mm or Bullnose | |
Wafer Surface Criteria | Refractive Index | At 632nm: No=2.2878; Ne=2.2033 |
Contamination | None | |
Particles Φ>0.3μm | ≤30 | |
Scratch, Chipping | None | |
Defect | No edge cracks, scratches, saw marks, stains |
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