Analysis Of Silicon Wafer Solar Cells

Silicon wafer solar cells currently dominate the market. Advanced characterization plays an important role in further improving the cost-effectiveness of solar cells. A significant amount of information can be obtained from the silicon samples prior to and after completion of the silicon wafer solar cell. Alfa Chemistry has the current advanced characterization technology to analyze silicon wafer solar cells in the laboratory or factory.

We provide a detailed loss analysis based entirely on measured parameters, which can quantify the main loss processes in silicon wafer solar cells. We can also thoroughly characterize each processing step and perform a detailed loss analysis on the final solar cell to improve the average efficiency and yield of silicon wafer solar cells.

Please contact us to learn more.

Alfa Chemistry Measurement Methods

Our measurement methods include, but are not limited to, the following:

Characterization of Partly Processed Silicon Wafers

• Raw wafer analysis by photoluminescence imaging
• Saw damage removal and texturing
• Phosphorus diffusion
• Silicon nitride deposition
• Screen printing and firing

Fig 1. PL intensity image of a high-quality (left) and poor-quality (right) multi-Si wafer. (Hoex B, et al. 2012)

Characterisation of Finished Solar Cells

Alfa Chemistry presents a detailed loss analysis, entirely based on measured parameters, that quantifies the main loss processes in silicon wafer solar cells. This loss analysis is completely based on high-precision measurements and provides a detailed quantification.

• The power losses of the solar cell due to front metal shading, front surface reflection of the active area, front surface escape, series and shunt resistance
• Non-perfect active-area internal quantum efficiency
• The forward-bias current at the one-sun maximum power point

Alfa Chemistry's Instrument Platforms

Alfa Chemistry has a variety of sophisticated instruments for silicon wafer solar cell analysis. Our measurement instruments include, but are not limited to, the following:

• BT Imaging LIS-R1 System
• Sinton Consulting WCT-120 System
• Tektronix 4200A-SCS Parameter
• Aescusoft Fimo-210 High Resolution Spectral Response Scanning System
• Sunny Instruments MeasurVision 3D Vision Measurement System
• PerkinElmer Lambda 950 UV/Vis/NIR Spectrophotometers

Testing Standard

• DIN V VDE V 0126-18-2-1-2007 Solar Silicon Wafers. Part 2-1: Measurement of The Geometric Dimensions of Silicon Wafers. Silicon Wafer Thickness
• DIN V VDE V 0126-18-2-3-2007 Solar Wafers. Part 2-3: Measurement of The Geometric Dimensions of Wafers. Waves and Distortion

Reference

1. Hoex B, et al. (2012). "Advanced Characterisation of Silicon Wafer Solar Cells." Energy Procedia. 15: 147-154.