Silicon wafer solar cells currently dominate the market. Advanced characterization plays an important role in further improving the cost-effectiveness of solar cells. A significant amount of information can be obtained from the silicon samples prior to and after completion of the silicon wafer solar cell. Alfa Chemistry has the current advanced characterization technology to analyze silicon wafer solar cells in the laboratory or factory.
We provide a detailed loss analysis based entirely on measured parameters, which can quantify the main loss processes in silicon wafer solar cells. We can also thoroughly characterize each processing step and perform a detailed loss analysis on the final solar cell to improve the average efficiency and yield of silicon wafer solar cells.
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Our measurement methods include, but are not limited to, the following:
Characterization of Partly Processed Silicon Wafers
Fig 1. PL intensity image of a high-quality (left) and poor-quality (right) multi-Si wafer. (Hoex B, et al. 2012)
Characterisation of Finished Solar Cells
Alfa Chemistry presents a detailed loss analysis, entirely based on measured parameters, that quantifies the main loss processes in silicon wafer solar cells. This loss analysis is completely based on high-precision measurements and provides a detailed quantification.
Alfa Chemistry has a variety of sophisticated instruments for silicon wafer solar cell analysis. Our measurement instruments include, but are not limited to, the following:
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